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Dr. Angelo Zizzari
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I-00142 Roma
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E-mail: info@keyres-technologies.com
 


 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 
 

 


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KeyRes Run Length Matrix 
 


           Step 1. Load an image              Step 2. Extract Run Length Features      Step 3. Another Run Length Feature
 

KeyRes Run Length Matrix is an advanced features extraction and image processing software for scientific and industrial imaging applications.

Supported Run Length Functions are: Short Runs Emphasis, Long Runs Emphasis, Gray Level Non-Uniformity, Run Length Non-Uniformity, Run Percentage, Low Gray Level Runs Emphasis, High Gray Level Runs Emphasis, Short Run Low Gray-Level Emphasis, Short Run High Gray-Level Emphasis, Long Run Low Gray-Level Emphasis and Long Run High Gray-Level Emphasis.

This software supports grayscale images stored in RTOG, TIFF, GIF, JPEG, BMP, DICOM or many other image file formats. Color images are converted into grayscale images in order to extract meaningful features. Algorithms are fast and optimized using sparse matrix notation and compilation in C/C++ language.

You can choose a pixel-based or a block-based scan, select a sliding window size, a gray level value, and start processing. It is possible to select the neighbouring pixels distance and eventually normalize the result within a 0-255 range.

After processing, perform a 3D visualization, define a correlation map and plot the features histogram. Then, export the feature values - or feature images  as well - and import into another image processing tool.

KeyRes Run Length Matrix is currently being used by leading research organizations and academic laboratories around the world.
 
 


 
 

the cost is 499,- Euro

Order Full Version 
(send an e-mail to info@keyres-technologies.com for more information)
 
 
 
 
Reference:

[1] D. H. Xu, A. Kurani, J. D. Furst, & D. S. Raicu, "Run-length encoding for volumetric texture", The 4th IASTED International Conference on Visualization, Imaging, and Image Processing - VIIP 2004, Marbella, Spain, September 6-8, 2004.

[2] F. Albregtsen, Statistical texture measures computed from gray level run-length matrices. University of Oslo, 1995.
 

 

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